TY  JOUR
TI  THE RESULTS OF THE TESTING OF COMPLEX CHIPS TO THE IMPACT OF HEAVY CHARGED PARTICLES
KW  irradiation of the samples ERIE
KW  thyristor effect
KW  failure events switching events of a single functional failures.
JO  Modeling of systems and processes
AU  Yankov, A.I.
AU  Meerson, V.E.
AU  Zolnikov, K.V.
AU  Kryukov, V..
PY  2016
IS  9
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov