TY  JOUR
TI  Development of the technology of systems on a chip for a modern electronic component base ECB
KW  Chip
KW  operability
KW  test interval
KW  multiple failures
KW  parameters
KW  simulation
KW  cell sensitivity
KW  efficiency
KW  test methods.
JO  Modeling of systems and processes
AU  Zhuravleva, I.V.
AU  Popova, E.A.
PY  2022
IS  14
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov