%0 Conference Article
%T PRODUCT LIFE ASSESSMENT METHODOLOGY UNDER RADIATION EXPOSURE
%A Zolnikov, K.V.
%A Evdokimova, S.A.
%A Yagodkin, A.S.
%A Grechanyy, S.V.
%A Parmon, P.L.
%K microelectronics, VLSI, radiation exposure, outer space, ionization and structural effects, bipolar technology
%J Modern aspects of modeling systems and processes
%D 2024
%P 5
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov