00823naa#a2200229#i#4500001001500000003001700015005001700032011001400049100004100063101000800104102000700112200015400119210013700273215001000410608002700420700001700447700001700464700001600481700003900497700001800536856003900554EN\\bibl\10303/en/manage/index20241122170419.5##a2219-0767##a20160111b2016####ek#y0engy0150####ca0#aRUS##aRU1#aTHE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIESeJournal article1#aVoronezhcFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozovd2016##a2 с.##aJournal article2local#1aGroshevgA. #1aKryukovgV. #1aSklyargV. #1aZolnikovgKonstantin Vladimirovich#1aChuburgK. A.4#atest.editorum.ruu/en/manage/index