00823naa#a2200229#i#450# EN\\bibl\10303 /en/manage/index 20241125235708.1 2219-0767 20160111b2016####ek#y0engy0150####ca RUS RU THE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES Journal article Voronezh FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov 2016 2 с. Journal article local Groshev A. Kryukov V. Sklyar V. Zolnikov Konstantin Vladimirovich Chubur K. A. test.editorum.ru /en/manage/index