LDR 00814naa#a2200217#i#450#
001     EN\\bibl\10304
003     /en/manage/index
005     20241112202955.2
011 ## _a2219-0767
100 ## _a20160111b2016####ek#y0engy0150####ca
101 0# _aRUS
102 ## _aRU
200 1# _aTHE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES
       _eJournal article
210 1# _aVoronezh
       _cFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov
       _d2016
215 ## _a2 с.
608 ## _aJournal article
       _2local
700 #1 _aAchkasov
       _gA. Vladimirovich
700 #1 _aYankov
       _gA. Il'ich
700 #1 _aZolnikov
       _gKonstantin Vladimirovich
700 #1 _aChubur
       _gK. A.
856 4# _atest.editorum.ru
       _u/en/manage/index