00814naa#a2200217#i#4500001001500000003001700015005001700032011001400049100004100063101000800104102000700112200015400119210013700273215001000410608002700420700003100447700002200478700003900500700001800539856003900557EN\\bibl\10304/en/manage/index20241112203119.2##a2219-0767##a20160111b2016####ek#y0engy0150####ca0#aRUS##aRU1#aTHE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIESeJournal article1#aVoronezhcFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozovd2016##a2 с.##aJournal article2local#1aAchkasovgA. Vladimirovich#1aYankovgA. Il'ich#1aZolnikovgKonstantin Vladimirovich#1aChuburgK. A.4#atest.editorum.ruu/en/manage/index