LDR 00757naa#a2200217#i#450#
001     EN\\bibl\8305
003     /en/manage/index
005     20250703215024.4
011 ## _a2308-8877
100 ## _a20151210b2015####ek#y0engy0150####ca
101 0# _aRUS
102 ## _aRU
200 1# _aCauses of damage to the metallization of integrated circuits in terms of currents of high density
       _eJournal article
210 1# _aVoronezh
       _cFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov
       _d2015
215 ## _a4 с.
608 ## _aJournal article
       _2local
700 #1 _aVrabiy
       _gEduard 
700 #1 _aAlekseev
       _gViktor 
700 #1 _aPiskun
       _gGennadiy 
700 #1 _aDegalevich
       _gDmitriy 
856 4# _atest.editorum.ru
       _u/en/manage/index