00757naa#a2200217#i#4500001001400000003001700014005001700031011001400048100004100062101000800103102000700111200011900118210013700237215001000374608002700384700002000411700002200431700002200453700002500475856003900500EN\\bibl\8305/en/manage/index20250630114344.1##a2308-8877##a20151210b2015####ek#y0engy0150####ca0#aRUS##aRU1#aCauses of damage to the metallization of integrated circuits in terms of currents of high densityeJournal article1#aVoronezhcFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozovd2015##a4 с.##aJournal article2local#1aVrabiygEduard #1aAlekseevgViktor #1aPiskungGennadiy #1aDegalevichgDmitriy 4#atest.editorum.ruu/en/manage/index