Russian Federation
Russian Federation
Russian Federation
Russian Federation
UDK 621 Общее машиностроение. Ядерная техника. Электротехника. Технология машиностроения в целом
The work is devoted to the study of the sensitivity of the electronic component base (ECB) to the effects of heavy charged particles. At the same time, the degree of sensitivity is distinguished depending on the functional group of ECB products to the effects of ionization radiation from outer space and on the design and technological design of ECB products. The paper presents the characteristics and conditions for the use of ECB in the radio-electronic equipment of outer space to ensure minimal sensitivity to the effects of ionization radiation and to the thyristor effect. After the sensitivity analysis of ECB products is carried out, a preliminary selection of ECB is performed, requiring testing. The article discusses the criteria for determining the ECB that requires testing and is possible to use without testing. The methods of increasing the durability of radio-electronic equipment of space equipment and the directions of optimization of the methodology of analysis of ECB lists are determined.
Electronic component base (ECB), heavy charged particles (HCP), ionization radiation (IR), outer space (OS), tests, radiation resistance
1. Useinov, R.G. Metodika raschetno-eksperimental'noy ocenki parametrov chuvstvitel'nosti EKB k effektam odinochnyh sobytiy pri vozdeystvii neytronov po rezul'tatam eksperimentov na TZCh i VEP / R.G. Useinov, A.S. Vatuev // Radiacionnaya stoykost' elektronnyh sistem "Stoykost'-2021" : sbornik trudov 24-y Vserossiyskoy nauchno-tehnicheskoy konferencii : nauchno-tehnicheskiy sbornik. - Lytkarino, 2021. - S. 55-56.
2. On analysis of the electromagnetic resistance of radioelectronic devices under impulse radiation / Y.P. Lonin, A.G. Ponomaryov, V.I. Chumakov // Problems of Atomic Science and Technology. – 2018. – T. 115(3). - Pp. 45-48.
3. Analysis of metrological provision problems of a test stand for testing radio-electronic products for resistance to irradiation with high-energy heavy ions / A.V. Butenko, E.M. Syresin, S.I. Tyutyunnikov [et al.] // Physics of Particles and Nuclei Letters. – 2019. – T. 16(6). – Pp. 734-743. – DOI: 10.1134/S1547477119060098.
4. Belyaeva, T.P. Metody podderzhki prinyatiya resheniy v chasti ocenki dostatochnosti trebovaniy tehnicheskogo zadaniya k mikroelektronnym komponentam i vozmozhnosti ih realizacii otechestvennymi predpriyatiyami elektronnoy promyshlennosti / T.P. Belyaeva, V.K. Zol'nikov // Politematicheskiy setevoy elektronnyy nauchnyy zhurnal Kubanskogo gosudarstvennogo agrarnogo universiteta. - 2012. - № 75. - S. 431-442.
5. Sistemy na kristalle (SNK) i vliyanie dannoy tehnologii na sozdanie sovremennoy EKB / V.K. Zol'nikov, S.A. Evdokimova, M.Yu. Arzamascev, A.E. Gridnev // Modelirovanie sistem i processov. - 2020. - T. 13, № 4. - S. 19-23. - DOI: 10.12737/2219-0767-2021-13-4-19-23.
6. Sklyar, V.A. Modelirovanie nizkointensivnogo vozdeystviya kosmicheskogo prostranstva / V.A. Sklyar, V.K. Zol'nikov, S.A. Evdokimova // Modelirovanie sistem i processov. - 2016. - T. 9, № 2. - S. 71-74. - DOI: 10.12737/23663.
7. Estimation of heavy ion beam parameters during single event effects testing / V.S. Anashin, P.A. Chubunov, G.A. Protopopov [et al.] // Proceedings of the 6th International Beam Instrumentation Conference, IBIC 2017. - 2017. - S. 94-97. - DOI: 10.18429/JACoW-IBIC2017-MOPCF10.
8. Zol'nikov, V.K. Matematicheskoe obespechenie ucheta impul'snogo izlucheniya v SAPR skvoznogo proektirovaniya SBIS / V.K. Zol'nikov // Sistemy upravleniya i informacionnye tehnologii. - 2009. - № 1-2 (35). - S. 242-244.
9. Platforma dlya proektirovaniya radiacionno-stoykih SNK kosmicheskogo primeneniya DARE65T / M. Kakoulin, S. Redant, G. Tes [i dr.] // Elektronika: Nauka, tehnologiya, biznes. - 2018. - № 8 (179). - S. 122-128. - DOI: 10.22184/1992-4178.2018.179.8.122.128.
10. Belyaeva, T.P. Upravlenie predpriyatiem na osnove sovremennyh IPI-tehnologiy / T.P. Belyaeva // Modelirovanie sistem i processov. – 2010. – № 1-2. – S. 13-18.
11. Introduction of rapid prototyping in solving applied problems in production / V.A. Brykin, A.P. Voroshilin, P.A. Uhov, A.V. Ripetskiy // Periodico Tche Quimica. - 2020. -T. 17, № 35. - Pp. 354-366.
12. Osobennosti eksperimental'nyh metodov issledovaniya mikroshem pamyati s pomehoustoychivym kodirovaniem dannyh / A.B. Boruzdina, M.S. Temirbulatov, A.A. Pechenkin [i dr.] // Problemy razrabotki perspektivnyh mikro- i nanoelektronnyh sistem (MES). - 2016. - № 4. - S. 184-189.
13. Osobennosti tehnologicheskogo processa izgotovleniya mikroshem kosmicheskogo naznacheniya po tehnologii KMOP KNS / V.K. Zol'nikov, S.A. Evdokimova, I.V. Zhuravleva [i dr.] // Modelirovanie sistem i processov. - 2020. - T. 13, № 3. - S. 53-58. - DOI: 10.12737/2219-0767-2020-13-3-53-58.
14. Sintez analogovoy EKB, ustoychivoy k VVF: arhitekturnye, strukturnye, shematicheskie resheniya / A.A. Lebedev, V.A. Komleva, N.M. Klokov [i dr.] // Trudy nauchno-issledovatel'skogo instituta sistemnyh issledovaniy Rossiyskoy akademii nauk. - 2017. - T. 7, № 2. - S. 118-119.
15. Balbekov, A.O. Metodiki modelirovaniya vozdeystviya TZCh na IS v marshrute proektirovaniya / A.O. Balbekov, M.S. Gorbunov // Trudy nauchno-issledovatel'skogo instituta sistemnyh issledovaniy Rossiyskoy akademii nauk. - 2020. - T. 10, № 4. - S. 4-13. - DOI: 10.25682/NIISI.2020.4.0001.
16. Belyaeva, T.P. Integrirovannaya sreda upravleniya proizvodstvennymi processami na osnove IPI-tehnologiy / T.P. Belyaeva // Modelirovanie sistem i processov. - 2010. - № 1-2. - S. 18-23.
17. Radiation-resistant optical cable for space technology objects / I.S. Ignatikov, I.A. Ovchinnikova, I.B. Peshkov [et al.] // 2020 Systems of Signals Generating and Processing in the Field of on Board Communications. – C. 9078596. – DOI: 10.1109/IEEECONF48371.2020.9078596.
18. Tel'puhov, D.V. Issledovanie i razrabotka avtomatizirovannyh sredstv modelirovaniya sluchaynyh sboev v sovremennyh kombinacionnyh KMOP IMS / D.V. Tel'puhov, A.I. Demeneva, V.V. Nadolenko // Izvestiya YuFU. Tehnicheskie nauki. - 2019. - № 4 (206). - S. 207-219. - DOI: 10.23683/2311-3103-2019-4-207-219.
19. Analiz problem modelirovaniya elementov KMOP BIS / V.K. Zol'nikov, S.A. Evdokimova, A.V. Fomichev [i dr.] // Modelirovanie sistem i processov. – 2018. – T. 11, № 4. – S. 20-25. – DOI: 10.12737/article_5c79642bd56f27.90584496.
20. Metody obespecheniya stoykosti elektronnoy komponentnoy bazy k odinochnym sobytiyam putem rezervirovaniya / A.E. Kozyukov, V.K. Zol'nikov, S.A. Evdokimova [i dr.] // Modelirovanie sistem i processov. – 2021. – T. 14. № 1. – S. 10-16. – DOI: 10.12737/2219-0767-2021-14-1-10-16.
21. Space radiation effects in electronics / L. Dilillo, A. Bosser, A. Javanainen, A. Virtanen // Rad-hard Semiconductor Memories. – 2018. - Pp. 1-64.
22. Rezul'taty ocenki nadezhnosti mikroshemy 1921VK035 / V.K. Zol'nikov, S.A. Evdokimova, E.V. Grosheva, A.I. Yan'kov // Modelirovanie sistem i processov. - 2019. - T. 12, № 4. - S. 42-46. - DOI: 10.12737/2219-0767-2020-12-4-42-46.
23. Chumakov, A.I. Lazernaya metodika ocenki parametrov chuvstvitel'nosti BIS k effektam vozdeystviya otdel'nyh zaryazhennyh chastic / A.I. Chumakov // Mikroelektronika. - 2018. - T. 47, № 3. - S. 198-204. - DOI: 10.7868/S0544126918030031.
