Diagnostics of complex-functional ECB during radiation resistance tests

A. I. Yankov

doi:doi:10.12737/2219-0767-2022-15-4-94-105

UDC 004.9 UDC 621.3

Diagnostics of complex-functional ECB during radiation resistance tests

Published в Modeling of systems and processes · Volume 15, Issue 4, 2022 · Pages 94–105 · Rubrics: Tehnicheskie nauki

DOI 10.12737/2219-0767-2022-15-4-94-105

Received: 12.12.2022 Accepted: 13.12.2022 Published: 13.12.2022

Authors

A. I. Yankov ¹

1 LLC «SPE Detector»
Russian Federation

ABSTRACT

The ionizing radiation of outer space provokes the appearance of radiation effects in the electronic component base (ECB) of spacecraft. The resulting radiation effects depend on the semiconductor structures used. Therefore, the topic of work related to the diagnosis of electronic components during testing for radiation resistance is relevant. The article discusses examples of diagnostics of such complex functional microcircuits as a microcontroller and a processor system on a chip. The functional control algorithm of the tested microcircuit includes testing the on-chip RAM, ADC, microcircuit core (ALU), UART, SPI serial interfaces. After the analysis of the functional capabilities of the microcircuit and the capabilities of test facilities and auxiliary equipment, it was decided to use the double control technique. This technique, when testing complex-functional products of electronic technology, provides control of the static parameters of the microcircuit and functional control of one core according to a given algorithm. To control microcircuits during radiation resistance testing, a functional control unit was developed, which includes a specialized testing board and implements various RAM testing modes (writing, storing, cyclic reading of information).

KEYWORDS

Electronic component base VLSI CMOS technology radiation resistance testing

Information References

Authors:

1. LLC «SPE Detector»

Russian Federation

Type:

Article

Pages:

from 94 to 105

Status:

Published

Subject area:

UDC 004.9
UDC 621.3

Language:

Russian

Keywords:

Electronic component base, VLSI, CMOS technology, radiation resistance, testing

References

1. Bulgakov, N.N. Metodicheskie osobennosti ispytaniy elektronnyh moduley, soderzhaschih moschnye MOP-tranzistory, na stoykost' k neobratimym effektam odinochnyh sobytiy / N.N. Bulgakov, V.F. Zinchenko, I.E. Sidorenko // Voprosy atomnoy nauki i tehniki. Seriya: fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2021. - № 1. - S. 12-16.

2. Osobennosti podgotovki i provedeniya issledovaniy obrazcov integral'noy shemy v slozhno-korpusnom ispolnenii BGA FLIP-CHIP / A.E. Kozyukov, N.Yu. Shul'ga, S.A. Yakovlev [i dr.] // Voprosy atomnoy nauki i tehniki. Seriya: fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2021. - № 3. - S. 33-43.

3. Tapero, K.I. Problemnye voprosy ocenki stoykosti elektronnoy komponentnoy bazy k vozdeystviyu pogloschennoy dozy ioniziruyuschego izlucheniya kosmicheskogo prostranstva / K.I. Tapero // Voprosy atomnoy nauki i tehniki. Seriya: fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2021. - № 4. - S. 5-14.

4. The effect of outer space radiation on the operation of BOKZ devices during their long-term operation / R.V. Bessonov, A.A. Kobeleva, A.N. Kurkina [et al.] // Sovremennye Problemy Distantsionnogo Zondirovaniya Zemli iz Kosmosa. - 2019. Vol. 16(5). - Pp. 85-96. - DOI:https://doi.org/10.21046/2070-7401-2019-16-5-85-96.

5. Reliability assessment and failure mode analysis of MEMS accelerometers for space applications / I. Marozau, M. Auchlin, V. Pejchal [et al.] // Microelectronics Reliability. - 2018. - Vol. 88-90. - Pp. 846-854. - DOI:https://doi.org/10.1016/j.microrel.2018.07.118.

6. Yan'kov, A.I. Osobennosti ispytaniy sovremennyh SBIS i formirovanie trebovaniy k parametram-kriteriyam godnosti IET / A.I. Yan'kov // Elementnaya baza otechestvennoy radioelektroniki : sbornik trudov I Rossiysko-Belorusskoy konferencii, posvyaschennoy 110-letiyu so dnya rozhdeniya O.V. Loseva. - M., 2013. - S. 65-66.

7. Ocenka pokazateley nadezhnosti kosmicheskih apparatov v usloviyah nepolnyh dannyh / M.I. Lomakin, A.V. Suhov, A.V. Dokukin, Yu.M. Niyazova // Kosmicheskie issledovaniya. - 2021. - T. 59, № 3. - S. 235-239. - DOI:https://doi.org/10.31857/S0023420621030080.

8. Osobennosti ispytaniy i ocenki radiacionnoy stoykosti kompleksirovannyh izdeliy EKB / D.V. Pechenkina, D.V. Boychenko, A.V. Sogoyan [i dr.] // Nanoindustriya. - 2020. - T. 13, № S4 (99). - S. 295-297. - DOI:https://doi.org/10.22184/1993-8578.2020.13.4s.295.297.

9. Impact of Electrical Stress on γ Ray Irradiated Double Polysilicon Self-Aligned (DPSA) PNP Bipolar Transistors / P. Zhang, K. Zhu, W.Chen [et al.] // IEEE Transactions on Device and Materials Reliability. - 2019. - Vol. 19(3). - Pp. 494-500. - C. 8737707. - DOI:https://doi.org/10.1109/TDMR.2019.2923170.

10. Ganesan, D. Effect of Solar Irradiation on Thermal Performance of Heatsink - Numerical and Experimental Study / D. Ganesan, V. Ramalingam // IEEE Transactions on Components. Packaging and Manufacturing Technology. - 2021. - Vol. 11(9). - Pp. 1471-1479. - C. 9514576. - DOI:https://doi.org/10.1109/TCPMT.2021.3105256.

11. Zol'nikov, V.K. Osobennosti vybora optimal'nogo sostava kontroliruemyh parametrov-kriteriev godnosti / V.K. Zol'nikov, A.I. Yan'kov, V.P. Kryukov / Radiacionnaya stoykost' elektronnyh sistem «Stoykost' - 2016» : sbornik tezisov dokladov 19 Vserossiyskoy nauchno-prakticheskoy konferencii po radiacionnoy stoykosti elektronnyh sistem. - Lytkarino, 2016. - S. 47-50.

12. Ocenka vozdeystviya ioniziruyuschih izlucheniy na elektronnye komponenty po rezul'tatam ispytaniy ogranichennyh vyborok / M.M. Venediktov, E.S. Obolenskaya, V.K. Kiselev, S.V. Obolenskiy // Zhurnal radioelektroniki. - 2017. - № 1. - S. 7.

13. Study the effect of space radiation on ISO-type multijunction solar cells / B.R. Uma, S. Krishnan, V. Radhakrishna, M. Sankaran // Journal of Materials Science: Materials in Electronics. - 2021. - Vol. 32(10). - Pp. 14014-14027. - DOI:https://doi.org/10.1007/s10854-021-05977-5.

14. Litvinenko, R.S. Methods for increasing the radiation resistance of 3D integration memory modules for aerospace applications / R.S. Litvinenko, I.V. Prokofiev, V.M. Matveev // International Journal of Innovative Technology and Exploring Engineering. - 2019. - Vol. 8(12). - Pp. 3551-3553. - DOI:https://doi.org/10.35940/ijitee.L2628.1081219.

15. Krivov, A.S. Metodicheskoe i tehnicheskoe obespechenie ispytaniy izdeliy elektronnoy promyshlennosti na stoykost' k elektrostaticheskim razryadam i odinochnym impul'sam napryazheniya / A.S. Krivov, V.A. Tuhas, A.I. Yan'kov // Peterburgskiy zhurnal elektroniki. - 2017. - № 2-3 (87-88). - S. 111-116.

16. Radiation response of distributed feedback bragg gratings for space applications / A. Morana, E. Marin, S. Girard [et al.] // IEEE Transactions on Nuclear Science. - 2020. - Vol. 67(1). - Pp. 284-288. - C. 8908801. - DOI:https://doi.org/10.1109/TNS.2019.2954575.

17. Rusanov, V.N. Vozmozhnosti kachestvennogo uluchsheniya otkazoustoychivosti, nadezhnosti i radiacionnoy stoykosti bortovyh vychislitel'nyh sistem / V.N. Rusanov // Aviakosmicheskoe priborostroenie. - 2021. - № 4. - S. 22-30. - DOI:https://doi.org/10.25791/aviakosmos.4.2021.1214.

18. Litvinenko, R.S. Development of software for measuring the electrical characteristics of the information storage micromodule with increased radiation resistance / R.S. Litvinenko, V.M. Matveev // International Journal of Innovative Technology and Exploring Engineering. - 2019. - Vol. 8(12). - Pp. 53-55. - DOI:https://doi.org/10.35940/ijitee.L2491.1081219.

19. Nikoforov, A.Yu. Radiacionnye effekty v KMOP IS / A.Yu. Nikiforov, V.A. Telec, A.I. Chumakov. - M.: Radio i svyaz', 1994. -164 s.

20. OST 134-1044-2007 Apparatura, pribory, ustroystva i oborudovanie kosmicheskih apparatov. Metody rascheta radiacionnyh usloviy na bortu kosmicheskih apparatov i ustanovleniya trebovaniy po stoykosti radioelektronnoy apparatury kosmicheskih apparatov k vozdeystviyu zaryazhennyh chastic kosmicheskogo prostranstva estestvennogo proishozhdeniya. - M. : CNIImash, 2007. - 179 s.

21. Podhod k testirovaniyu slozhno-funkcional'nyh mikroshem primenennyy pri ispytaniyah dvuhprocessornoy sistemy na kristalle na baze yader 32-razryadnyh processorov COS / A.I. Yan'kov, A.V. Achkasov, K.V. Zol'nikov [i dr.] / Elementnaya baza otechestvennoy radioelektroniki : sbornik trudov I Rossiysko-Belorusskoy konferencii, posvyaschennoy 110-letiyu so dnya rozhdeniya O.V. Loseva. - M., 2013. - S. 96-99.

Доступ и загрузка

🗂 JATS XML ❝ To cite 📎 Citations

—

Views

—

Downloads

Citations

Индексируется в

Diagnostics of complex-functional ECB during radiation resistance tests

Confirmation

Регистрация