Russian Federation
Russian Federation
Russian Federation
GRNTI 29.01 Общие вопросы физики
The paper considers the requirements for test benches for studying the appearance of single radiation effects in the electronic component base (ECB) at elevated and low temperatures. Examples of the influence of the temperature regime on the levels of ECB stability, as well as the influence of the passive and active modes of radio-electronic equipment on the occurrence of single events are presented.
electronic component base (ECB), tests, single radiation effect, outer space (OS), ionizing radiation (IR), CMOS technology
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