Abstract and keywords
Abstract (English):
The article proposes a method for calculating and experimental evaluation of the service life of products in the specified radiation conditions of outer space. The described method of estimating the resource of products takes into account the additive nature of ionization and structural effects in the specified radiation conditions of outer space. This method includes experimental and computa-tional stages.

Keywords:
microelectronics, VLSI, radiation exposure, outer space, ionization and structural effects, bipolar technology
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References

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